In X-Ray Diffraction and Spectrometer Laboratories equipped, with 2 different models of X-Ray Diffractometer, 3 different models of X-Ray Fluorescence Spectrometer and an Optic Emission Spectrometer. Qualitative/quantitative analyses are carried out in organic/inorganic materials in order to control product quality and process development.
With X-Ray Diffractometer (XRD) system; qualitative and quantitative phase (mineralogical) identification of inorganic solid materials, amorphous phase content, crystallite size, mineralogical changes occur in the material structure due to temperature changes, phase (mineralogical) content, thickness, density and surface roughness of thin films coated on a substrate, determination of texture and residual stress of metallic materials can be analyzed.
With X-Ray Fluorescence Spectrometer (XRF) system; element content of solid materials (bulk or pressed powder) is identified qualitatively, semi-quantitatively/standardless and quantitatively. Besides; restricted elements (Cr+6, Pb, Cd, Hg, PBB and PBDE) in plastic, textile and metallic materials are determined according to the “Restriction of Hazardous Substances (RoHS)” directive.
With Optical Emission Spectrometer (OES) system; element content of aluminium, iron, magnesium and copper based alloys are identified quantitatively.
Related Industries: Ceramic, metal, composite, coatings, semiconductors, data storages, electronics, energy, foundry, plastic, textile, optic, pharmaceutical, biomaterials, archeology, geology, cement, mining, mechanical, photonic and telecommunication are the application fields used frequently.